Testing the 400MHz IBM Generation-4 CMOS Chip.

FOOTE T G; HOFFMAN D E; HUOTT W V; KOPROWSKI T J; ROBBINS B J; KUSKO M P

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J-GLOBAL ID：200902194565756754 Reference number：98A0223029

Testing the 400MHz IBM Generation-4 CMOS Chip.

400MHzのIBM第四世代CMOSチップのテスト

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Author (6)： , , , , ,
Material：
Volume： 1997 Page： 106-114 Publication year： 1997
JST Material Number： E0211B ISSN： 1089-3539 Document type： Proceedings
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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General , Measurement,testing and reliability of solid-state devices

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