Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe<sub>2</sub>.

BIRKHOLZ M; KANSCHAT P; WEISS T; CZERWENSKY M; LIPS K

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J-GLOBAL ID：200902194616676408 Reference number：99A0598773

Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe₂.

CuGaSe₂における外因性及び内因性欠陥の低温電子常磁性共鳴研究

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Volume： 59 Issue： 19 Page： 12268-12271 Publication year： May. 15, 1999
JST Material Number： D0746A ISSN： 1098-0121 CODEN： PRBMDO Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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EPR of metals and semiconductors

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Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe2.

Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe₂.