Art
J-GLOBAL ID：200902195969433157   Reference number：99A0672753

Substrate Noise Measurement by using Noise-selective Voltage Comparators in Analog and Digital Mixed-signal Integrated Circuits.

アナログディジタル混載集積回路における雑音選択電圧コンパレータを用いた基板雑音測定
Author (3)：
MAKIE-FUKUDA K

About MAKIE-FUKUDA K

(Hitachi Ltd., Tokyo, JPN)

About Hitachi Ltd., Tokyo, JPN

, 
ANBO T

About ANBO T

(Hitachi ULSI Engineering Corp., Tokyo, JPN)

About Hitachi ULSI Engineering Corp., Tokyo, JPN

, 
TSUKADA T

About TSUKADA T

(Hitachi Ltd., Tokyo, JPN)

About Hitachi Ltd., Tokyo, JPN


Material：
Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference  (Conference Record. IEEE Instrumentation and Measurement Technology Conference)

About Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference


Volume： 1998  Issue： Vol.2  Page： 1377-1380  Publication year： 1998 
JST Material Number： B0689B  ISSN： 1091-5281  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*noise measurement (signal)

About noise measurement (signal)

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
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基板雑音

About 基板雑音

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
General 
(NC03161C)

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,  Measurement,testing and reliability of solid-state devices 
(NC03040G)

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Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
アナログディジタル混載集積回路

About アナログディジタル混載集積回路

, 
雑音

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, 
電圧コンパレータ

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, 
基板雑音

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