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J-GLOBAL ID：200902195969433157   Reference number：99A0672753

Substrate Noise Measurement by using Noise-selective Voltage Comparators in Analog and Digital Mixed-signal Integrated Circuits.

アナログディジタル混載集積回路における雑音選択電圧コンパレータを用いた基板雑音測定
Author (3)：
MAKIE-FUKUDA K

About MAKIE-FUKUDA K

(Hitachi Ltd., Tokyo, JPN)

About Hitachi Ltd., Tokyo, JPN

, 
ANBO T

About ANBO T

(Hitachi ULSI Engineering Corp., Tokyo, JPN)

About Hitachi ULSI Engineering Corp., Tokyo, JPN

, 
TSUKADA T

About TSUKADA T

(Hitachi Ltd., Tokyo, JPN)

About Hitachi Ltd., Tokyo, JPN


Material：
Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference  (Conference Record. IEEE Instrumentation and Measurement Technology Conference)

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Volume： 1998  Issue： Vol.2  Page： 1377-1380  Publication year： 1998 
JST Material Number： B0689B  ISSN： 1091-5281  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*noise measurement(signal)

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,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
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基板雑音

About 基板雑音

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
General 
(NC03161C)

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,  Measurement,testing and reliability of solid-state devices 
(NC03040G)

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Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
アナログディジタル混載集積回路

About アナログディジタル混載集積回路

, 
雑音

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, 
電圧コンパレータ

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, 
基板雑音

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