Art
J-GLOBAL ID:200902196489108724   Reference number:95A0908437

EMC/EMI: Current Status and Issues of International Standardization Technology in Japan. New Methodological Developments of Measurements. Measurement of the Electrical Properties by the Time-Domain Reflectometry.

EMC/EMI-国際標準化技術における我が国の現状と課題 測定法の新たな展開 ステップ応答波形の解析による電気的特性の測定 折れ曲がり線路からの反射や放射の測定などへのTDRの活用
Author (1):
Material:
Volume: 78  Issue:Page: 845-846  Publication year: Sep. 1995 
JST Material Number: F0019A  ISSN: 0913-5693  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=95A0908437&from=J-GLOBAL&jstjournalNo=F0019A") }}
JST classification (1):
JST classification
Category name(code) classified by JST.
Noise measurement 

Return to Previous Page