Noninvasive investigation of defects in multicrystalline silicon and photovoltaic devices by photomagnetic detection using superconducting quantum interference device magnetometers.

BEYER J; ZHONG Q; SCHURIG T

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J-GLOBAL ID：200902198410247778 Reference number：01A0157907

Noninvasive investigation of defects in multicrystalline silicon and photovoltaic devices by photomagnetic detection using superconducting quantum interference device magnetometers.

超伝導量子干渉素子磁力計を利用する光磁気検出法による多結晶シリコンと光起電力素子中の欠陥の非破壊研究

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Material：
Volume： 77 Issue： 19 Page： 3107-3109 Publication year： Nov. 06, 2000
JST Material Number： H0613A ISSN： 0003-6951 CODEN： APPLAB Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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Experimental techniques of observation of lattice defects , Measurement,testing and reliability of solid-state devices

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