Art
J-GLOBAL ID：200902198574588070   Reference number：01A0854064

Measurement Technique for Characterizing Memory Effects in RF Power Amplifiers.

RF電力増幅器におけるメモリー効果を特性化する測定法
Author (3)：
VUOLEVI J H K

About VUOLEVI J H K

(Univ. Oulu, Oulu, FIN)

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, 
RAHKONEN T

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(Univ. Oulu, Oulu, FIN)

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, 
MANNINEN J P A

About MANNINEN J P A

(Univ. Oulu, Oulu, FIN)

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Material：
IEEE Transactions on Microwave Theory and Techniques  (IEEE Trans Microw Theory Tech)

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Volume： 49  Issue： 8  Page： 1383-1389  Publication year： Aug. 2001 
JST Material Number： C0229A  ISSN： 0018-9480  CODEN： IETMAB  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*memory effect

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,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Amplification circuits 
(NC05040U)

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Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
RF

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, 
電力増幅器

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, 
メモリー効果

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, 
特性化

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, 
測定法

About 測定法


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