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J-GLOBAL ID:200902205348835370   Reference number:05A0376875

面型パターン照明を用いた凹凸判定機能付き欠陥検査法の開発

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Volume: 2005  Issue: 春季(CD-ROM)  Page: E67  Publication year: Mar. 01, 2005 
JST Material Number: Y0914A  Document type: Proceedings
Article type: 短報  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Nondestructive testing  ,  Graphic and image processing in general 
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