Art
J-GLOBAL ID:200902207181208061   Reference number:09A0587830

Highly Accurate Method for Measuring Ordinary and Extraordinary Refractive Indices of Liquid Crystal Materials, Cell Thickness, and Pretilt Angle of Liquid Crystal Cells Using Ellipsometry

偏光解析法を使用して液晶材の正規と特別屈率,液晶セルのセル厚みとプレチルト角を測定する非常に正確な方法
Author (4):
Material:
Volume: 48  Issue: 5,Issue 1  Page: 051502.1-051502.9  Publication year: May. 25, 2009 
JST Material Number: G0520B  ISSN: 0021-4922  CODEN: JJAPB6  Document type: Article
Article type: 原著論文  Country of issue: United Kingdom (GBR)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

JST classification (1):
JST classification
Category name(code) classified by JST.
Liquid crystals in general 
Terms in the title (4):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page