Art

J-GLOBAL ID：200902209894802519   Reference number：08A0104732

Threshold photoelectron spectroscopy on inner-valence ionic states of NO

NOの内部価電子イオン状態についてのしきい値光電子分光法

Author (6)： HIKOSAKA Y. (UVSOR Facility, Inst. for Molecular Sci., Okazaki 444-8585, JPN) ,  AOTO T. (Photon Factory, Inst. of Materials Structure Sci., Tsukuba, Ibaraki 305-0801, JPN) ,  ITO K. (Photon Factory, Inst. of Materials Structure Sci., Tsukuba, Ibaraki 305-0801, JPN) ,  TERASAKA Y. (Graduate School of Engineering Sciences, Kyushu Univ., 6-1 Kasuga Park, Fukuoka 816-8580, JPN) ,  HIRAYAMA R. (Graduate School of Engineering Sciences, Kyushu Univ., 6-1 Kasuga Park, Fukuoka 816-8580, JPN) ,  MIYOSHI E. (Graduate School of Engineering Sciences, Kyushu Univ., 6-1 Kasuga Park, Fukuoka 816-8580, JPN)
Material： Journal of Chemical Physics  (J Chem Phys)
Volume： 128  Issue： 4  Page： 044320  Publication year： Jan. 28, 2008 
JST Material Number： C0275A  ISSN： 0021-9606  CODEN： JCPSA6  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *nitrogen monoxide ,  valence electron ,  *threshold ,  Photoelectron Spectroscopy ,  cation ,  *photoelectron spectrum ,  MRCI method ,  spectral line assignment ,  dissociation ,  product material ,  spectroscopy ,  potential energy curve ,  Rydberg state ,  fragment ,  Nitrogen ,  simultaneous measurement

JST classification (2)： Electron spectroscopy in general and of inorganic molecules  (BH06091Y) ,  Nonmetallic compounds  (CD01070R)

Terms in the title (4)： NO ,  価電子 ,  しきい値 ,  光電子分光法