Art
J-GLOBAL ID:200902210473507451   Reference number:09A0340949

Effects of Humidity and Sample Surface Free Energy on AFM Probe-Sample Interactions and Lateral Force Microscopy Image Contrast

AFMプローブ-試料相互作用および水平力顕微鏡の画像コントラストに対する湿度と試料表面の自由エネルギーの影響
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Material:
Volume: 25  Issue:Page: 3494-3503  Publication year: Mar. 17, 2009 
JST Material Number: A0231B  ISSN: 0743-7463  CODEN: LANGD5  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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Microscopy determination of structures  ,  Surface chemistry in general 

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