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J-GLOBAL ID：200902210615152869   Reference number：03A0487666

Theory of Q control in atomic force microscopy

原子間力顕微鏡におけるQ制御の理論
Author (2)：
RODRIGUEZ T R

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(CSIC, Madrid, ESP)

About CSIC, Madrid, ESP

, 
GARCIA R

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(CSIC, Madrid, ESP)

About CSIC, Madrid, ESP


Material：
Applied Physics Letters  (Appl Phys Lett)

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Volume： 82  Issue： 26  Page： 4821-4823  Publication year： Jun. 30, 2003 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*atomic force microscope

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,...
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JST classification (1)：
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Electron and ion microscopes 
(BD02050B)

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原子間力顕微鏡

About 原子間力顕微鏡

, 
理論

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