Cryo-transfer TEM study of vacancy cluster formation in thin films of aluminum and copper elongated at low temperature.

MUKOUDA I; SHIMOMURA Y; KIRITANI M

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J-GLOBAL ID：200902217025302959 Reference number：03A0387246

Cryo-transfer TEM study of vacancy cluster formation in thin films of aluminum and copper elongated at low temperature.

低温で伸張したアルミニウム及び銅薄膜における空孔クラスタ形成のクライオ-トランスファーTEMを用いた研究

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Volume： A350 Issue： 1/2 Page： 37-43 Publication year： Jun. 15, 2003
JST Material Number： D0589B ISSN： 0921-5093 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Lattice defects in metals , Irradiational changes of metals

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