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J-GLOBAL ID:200902218713192543   Reference number:04A0257333

Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy

電子後方散乱回折および配向イメージング顕微鏡法の開発のために前進的段階
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Volume: 213  Issue:Page: 214-224  Publication year: Mar. 2004 
JST Material Number: B0454B  ISSN: 0022-2720  Document type: Article
Article type: 原著論文  Country of issue: United Kingdom (GBR)  Language: ENGLISH (EN)
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Thesaurus term/Semi thesaurus term
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Microscopy determination of structures  ,  Electron diffraction methods 

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