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J-GLOBAL ID：200902218834091302   Reference number：06A0703413

Survey of Test Vector Compression Techniques

試験ベクトル圧縮技術の概観
Author (1)：
TOUBA Nur A.

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(Univ. Texas at Austin)

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Material：
IEEE Design & Test of Computers  (IEEE Des Test Comput)

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Volume： 23  Issue： 4  Page： 294-303  Publication year： Jul. 2006 
JST Material Number： B0007C  ISSN： 0740-7475  Document type： Article
Article type： 解説  Country of issue： United States (USA)  Language： ENGLISH (EN)
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integrated circuit

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Measurement,testing and reliability of solid-state devices 
(NC03040G)

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