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J-GLOBAL ID：200902221137626185   Reference number：03A0407376

X-Ray Stress Measurement Method for Single Crystal with Unknown Stress-Free Lattice Parameter

応力フリー格子定数が未知の単結晶のX線応力測定

Author (3)： SUZUKI H (Tokyo Metropolitan Univ., Tokyo, JPN) ,  AKITA K (Musashi Inst. Technol., Tokyo, JPN) ,  MISAWA H (Tokyo Metropolitan Univ., Tokyo, JPN)
Material： Japanese Journal of Applied Physics. Part 1. Regular Papers, Short Notes & Review Papers  (Japanese Journal of Applied Physics. Part 1. Regular Papers, Brief Communications & Review Papers)
Volume： 42  Issue： 5A  Page： 2876-2880  Publication year： May. 15, 2003 
JST Material Number： G0520B  ISSN： 0021-4922  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *stress (mechanics) ,...

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JST classification (2)： Mechanics of elasticity in general  (HC02010M) ,  Mechanical properties of solids in general  (BL01021C)

Reference (13)：

• 1) X Sen Oryoku Sokutei Ho (X-Ray Stress Measuring Method), ed. Society of Materials Science Japan (Yokendo, Tokyo, 1990) 2nd ed., p. 60 [in Japanese].
• 2) E. C. Dickey, V. P. Dravid and C. R. Hubbard: J. Am. Ceram. Soc. 80 (1997) 2773.
• 3) T. Yoshiike, N. Fujii and S. Kozaki: Jpn. J. Appl. Phys. 36 (1997) 5764.
• 4) A. Ward III and R. W. Hendricks: Proc. 5th Int. Conf. Residual Stresses, Sweden, 1997, p. 1054.
• 5) M. Barral and J. M. Sprauel: Proc. 1st Int. Conf. Residual Stresses, Germany, 1987, p. 265.

Terms in the title (4)： 応力 ,  格子定数 ,  単結晶 ,  X線応力測定