PZT(65/35) and PLZT(8/65/35) thin films by sol-gel process: a comparative study on the structural, microstructural and electrical properties

THOMAS R; MOCHIZUKI S; MIHARA T; ISHIDA T

Art

J-GLOBAL ID：200902221138073732 Reference number：03A0708607

PZT(65/35) and PLZT(8/65/35) thin films by sol-gel process: a comparative study on the structural, microstructural and electrical properties

ゾル-ゲル法によるPZT(65/35)及びPLZT(8/65/35)薄膜構造,微細構造及び電気特性の比較研究

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Material：
Volume： 443 Issue： 1/2 Page： 14-22 Publication year： Oct. 22, 2003
JST Material Number： B0899A ISSN： 0040-6090 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Oxide thin films , Ferroelectrics,antiferroelectrics and ferroelasticity

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