Art

J-GLOBAL ID：200902221995216793   Reference number：08A0626960

Advanced x-ray stress analysis method for a single crystal using different diffraction plane families

異なる回折面族を用いた単結晶に対する最新のX線応力解析

Author (5)： IMAFUKU Muneyuki (Materials Characterization Center, Nippon Steel Technoresearch Corp., Futtsu, Chiba 293-0011, JPN) ,  SUZUKI Hiroshi (Quantum Beam Sci. Directorate, Japan Atomic Energy Agency, Tokai, Naka-gun, Ibaraki 319-1195, JPN) ,  SUEYOSHI Kazuyuki (Dep. of Mechanical Systems Engineering, Musashi Inst. of Technol., Setagaya, Tokyo 158-8557, JPN) ,  AKITA Koichi (Dep. of Mechanical Systems Engineering, Musashi Inst. of Technol., Setagaya, Tokyo 158-8557, JPN) ,  OHYA Shin-ichi (Dep. of Mechanical Systems Engineering, Musashi Inst. of Technol., Setagaya, Tokyo 158-8557, JPN)
Material： Applied Physics Letters  (Appl Phys Lett)
Volume： 92  Issue： 23  Page： 231903  Publication year： Jun. 09, 2008 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *stress analysis ,  *X-Ray Diffraction ,  single crystal ,  *Iron ,  X-ray source ,  crystal orientation ,  stress distribution ,  residual stress ,  *analysis

JST classification (1)： Mechanical properties of metals  (BL01022T)

Terms in the title (4)： 回折 ,  単結晶 ,  X線 ,  応力解析