Art
J-GLOBAL ID：200902222818402060
Reference number：03A0184037
Lateral Size Effect in the Lifetime Measurement by Frequency-Dependent Surface Photovoltage Technique.
周波数依存の表面光起電力法による寿命測定への横方向サイズ効果
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Author (4)：
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Material：
Volume：
42
Issue：
1
Page：
33-37
Publication year：
Jan. 15, 2003
JST Material Number：
G0520B
ISSN：
0021-4922
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
Thesaurus term：
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Electric conduction in crystalline semiconductors
Terms in the title (5)：
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