Art
J-GLOBAL ID：200902223180985213   Reference number：03A0338382

Electronic structure calculations of vacancy-Ni-vacancy in diamond.

ダイヤモンド中の空格子点-Ni-空格子点欠陥に対する電子状態計算
Author (1)：
ISHII NOBUHIKO

About ISHII NOBUHIKO

(福井工大)

About 福井工大


Material：
福井工業大学研究紀要  (Memoirs of Fukui University of Technology)

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Issue： 33 第1部  Page： 359-366  Publication year： Mar. 20, 2003 
JST Material Number： X0305A  ISSN： 0286-8571  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
Thesaurus term：
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Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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*semiconductor thin film

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,...
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JST classification (3)：
JST classification
Category name(code) classified by JST.
Semiconductor thin films 
(BK14040E)

About Semiconductor thin films

,  Lattice defects in semiconductors 
(BK12040Q)

About Lattice defects in semiconductors

,  EPR of metals and semiconductors 
(BM07022M)

About EPR of metals and semiconductors

Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
ダイヤモンド

About ダイヤモンド

, 
空格子点

About 空格子点

, 
Ni

About Ni

, 
格子点欠陥

About 格子点欠陥

, 
電子状態計算

About 電子状態計算


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