Cross-correlation measurements in searching for a trace of the gate voltage noise in a JFET

HASHIGUCHI S; HOSONO S; OHKI M; TACANO M; SIKULA J

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J-GLOBAL ID：200902226532102090 Reference number：04A0614354

Cross-correlation measurements in searching for a trace of the gate voltage noise in a JFET

JFETのゲート電圧雑音の追跡に使用される相関関係測定

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Author (5)： , , , ,
Material：
Volume： 5470 Page： 529-537 Publication year： 2004
JST Material Number： D0943A ISSN： 0277-786X CODEN： PSISDG Document type： Proceedings
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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