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J-GLOBAL ID:200902229113831749   Reference number:05A0465312

Measurement of High Power Microwave Properties of Superconductor Films

超伝導薄膜のハイパワーマイクロ波特性の測定法
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Volume: 105  Issue: 33(SCE2005 1-11)  Page: 51-54  Publication year: Apr. 20, 2005 
JST Material Number: S0532B  ISSN: 0913-5685  Document type: Proceedings
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Properties of oxide superconductors  ,  Measuring methods and instruments of R,L,C,Q, and dielectric constant 
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