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J-GLOBAL ID:200902234082066910   Reference number:06A0333822

Experimental Determination of Electron Effective Attenuation Length in Al Thin Film

Al薄膜中の電子の有効減衰長の実験による決定
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Material:
Issue: 2005-5 CD-ROM  Page: PART B,85  Publication year: Nov. 2005 
JST Material Number: Y0762A  ISSN: 1344-6320  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Electron spectroscopy 
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