Art

J-GLOBAL ID：200902236588214058   Reference number：07A1216170

On the fault tolerance of a clustered single-electron neural network for differential enhancement

差異増強のためのクラスター化単電子ニューラルネットワークの障害耐久力(フォールトトレランス)について

Author (5)： OYA Takahide (Graduate School of Information Sci. and Technol., Hokkaido Univ.) ,  SCHMID Alexandre (Microelectronic Systems Lab., Swiss Federal Inst. of Technol. (EPFL)) ,  ASAI Tetsuya (Graduate School of Information Sci. and Technol., Hokkaido Univ.) ,  LEBLEBICI Yusuf (Microelectronic Systems Lab., Swiss Federal Inst. of Technol. (EPFL)) ,  AMEMIYA Yoshihito (Graduate School of Information Sci. and Technol., Hokkaido Univ.)
Material： IEICE Electronics Express (Web)  (IEICE Electron Express (Web))
Volume： 2  Issue： 3  Page： 76-80 (J-STAGE)  Publication year： 2005 
JST Material Number： U0039A  ISSN： 1349-2543  Document type： Article
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *fault tolerance ,...
Semi thesaurus term： *fault tolerance ,...

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JST classification (1)： Other electronic circuits  (NC05090X)

Reference (5)：

• [1] T. Asai, M. Ohtani, and H. Yonezu, “Analog integrated circuits for the Lotka-Volterra competitive neural networks, ”IEEE Trans. Neural Networks, vol. 10, no. 5, pp. 1222-1231, 1999.
• [2] A. Schmid and Y. Leblebici, “Robust Circuit and System Design Methodologies for Nanometer-Scale Devices and Single-Electron Transistors, ” Proc. IEEE-NANO03, vol. 2, pp. 516-519, 2003.
• [3] T. Oya, T. Asai, R. Kagaya, T. Hirose, and Y. Amemiya, “Neuromorphic Single-Electron Circuit and Its Application to Temporal-Domain Neural Competition, ”Proc. 2004 Int. Symp. on NOLTA, pp. 235-239, 2004.
• [4] T. Oya, T. Asai, T. Fukui, and Y. Amemiya, “Reaction-Diffusion Systems Consisting of Single-Electron Oscillators, ”Int. J. Unconventional Computing, vol. 1, no. 2, 2005.
• [5] T. Yamada, M. Akazawa, T. Asai, and Y. Amemiya, “Boltzmann machine neural network devices using single-electron tunneling, ”Nanotechnology, vol. 12, no. 1, pp. 60-67, 2001.

Terms in the title (7)： 差異 ,  増強 ,  クラスター化 ,  電子 ,  ニューラルネットワーク ,  障害耐久力 ,  フォールトトレランス