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J-GLOBAL ID:200902237010446840   Reference number:07A0856985

Scanning Photoinduced Impedance Microscopy Using Amorphous Silicon Photodiode Structures

非晶質シリコンフォトダイオード構造を用いる走査光誘起インピーダンス顕微鏡観察
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Material:
Volume: 79  Issue: 16  Page: 6208-6214  Publication year: Aug. 15, 2007 
JST Material Number: A0395A  ISSN: 0003-2700  CODEN: ANCHAM  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Thesaurus term/Semi thesaurus term
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Microscopy determination of structures  ,  Analytical instruments 

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