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J-GLOBAL ID:200902237222447943   Reference number:05A0652351

Interface study of transition metal (Fe, Zr) on 4H-SiC(0001)Si face: photoemission electron microscopy and soft X-ray fluorescence spectroscopy

4H-SiC(0001)Si面上の遷移金属(Fe,Zr)の界面研究 光電子放出顕微鏡と軟X線蛍光分光法
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Material:
Volume: 249  Issue: 1-4  Page: 362-366  Publication year: Aug. 15, 2005 
JST Material Number: B0707B  ISSN: 0169-4332  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Thesaurus term/Semi thesaurus term
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JST classification (3):
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Category name(code) classified by JST.
Semiconductor-metal contacts  ,  Photoemission and photoelectrons  ,  X-ray spectra in general.Including X-ray 

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