Art
J-GLOBAL ID：200902238397279756   Reference number：03A0598550

Characterization of Fritting Phenomena on Al Electrode for Low Contact Force Probe Card.

低接触力プローブカードのためのAl電極上のフリッティング現象の特性評価
Author (3)：
KATAOKA K

About KATAOKA K

(Univ. Tokyo, Tokyo, JPN)

About Univ. Tokyo, Tokyo, JPN

, 
ITOH T

About ITOH T

(Univ. Tokyo, Tokyo, JPN)

About Univ. Tokyo, Tokyo, JPN

, 
SUGA T

About SUGA T

(Univ. Tokyo, Tokyo, JPN)

About Univ. Tokyo, Tokyo, JPN


Material：
IEEE Transactions on Components and Packaging Technologies  (IEEE Trans Compon Packag Technol)

About IEEE Transactions on Components and Packaging Technologies


Volume： 26  Issue： 2  Page： 382-387  Publication year： Jun. 2003 
JST Material Number： H0255C  ISSN： 1521-3331  CODEN： ITCPFB  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
*probe (instrumentation element)

About probe (instrumentation element)

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
フリッティング現象

About フリッティング現象

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=03A0598550&from=J-GLOBAL&jstjournalNo=H0255C") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
接触力

About 接触力

, 
プローブカード

About プローブカード

, 
Al

About Al

, 
現象

About 現象

, 
特性評価

About 特性評価


Return to Previous Page

TOP

BOTTOM