Measurement of charge carrier dynamics in diamond thin films using a fast TOF system with a UV pulsed laser

OSHIKI Y.; KANEKO J.h.; FUJITA F.; HOMMA A.; WATANABE H.; MEGURO K.; YAMAMOTO Y.; IMAI T.; SATO K.; TSUJI K.; KAWAMURA S.; FURUSAKA M.

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J-GLOBAL ID：200902238810377524 Reference number：08A0569200

Measurement of charge carrier dynamics in diamond thin films using a fast TOF system with a UV pulsed laser

UVパルスレーザを伴う迅速TOFシステムを用いてのダイヤモンド薄膜中の電荷キャリアの動特性の測定

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Material：
Volume： 17 Issue： 4-5 Page： 833-837 Publication year： Apr. 2008
JST Material Number： W0498A ISSN： 0925-9635 Document type： Article
Article type：短報 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Thin films of other inorganic compounds , Carbon and its compounds

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