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J-GLOBAL ID:200902240200844087   Reference number:08A0145747

INTERFACE RESISTIVITY ESTIMATION OF BONDED Si FOR HIGH PERFORMANCE RADIATION DETECTOR DEVELOPMENT

高性能放射線検出器開発に対するボンドしたSiの界面抵抗率の評価
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Material:
Issue: 2007-12  Page: 11-20  Publication year: Dec. 2007 
JST Material Number: L1349A  Document type: Proceedings
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Radiation detection and detectors  ,  Electric conduction in crystalline semiconductors 

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