Art

J-GLOBAL ID：200902245618284071   Reference number：07A0397931

The fabrication and application of Zernike electrostatic phase plate

Zernike静電位相板の製作と適用

Author (9)： HUANG Sen-Hui (National Tsing-Hua Univ., HsinChu) ,  WANG Wan-Jhih (National Tsing-Hua Univ., HsinChu) ,  CHANG Chia-Seng (Academia Sinica, Taipei) ,  HWU Yeu-Kuang (Academia Sinica, Taipei) ,  TSENG Fan-Gang (National Tsing-Hua Univ., HsinChu) ,  KAI Ji-Jung (National Tsing-Hua Univ., HsinChu) ,  CHEN Fu-Rong (National Tsing-Hua Univ., HsinChu) ,  CHEN Fu-Rong (Academia Sinica, Taipei) ,  CHEN Fu-Rong (National Synchrotron Radiation Res. Center, HsinChu, TWN)
Material： Journal of Electron Microscopy  (J Electron Microsc)
Volume： 55  Issue： 6  Page： 273-280  Publication year： Dec. 2006 
JST Material Number： W1384A  ISSN： 0022-0744  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： micromachine ,...
Semi thesaurus term： 静電位相板 ,...

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JST classification (1)： Electron and ion microscopes  (BD02050B)

Reference (22)：

• WILLIAMS, D B. Transmission Electron Microscopy. 1996
• BUSECK, P R. High-Resolution Transmission Electron Microscopy and Associated Techniques. 1992
• COWLEY, J M. Diffraction Physics. 1995
• SPENCE, J C H. High-Resolution Electron Microscopy. 2003
• ZERNIKE, F. Phase contrast, a new method for the microscopic observation of transparent objects. Physica. 1942, 9, 686-693

Terms in the title (2)： 位相板 ,  製作