Art

J-GLOBAL ID：200902250973196004   Reference number：06A0693688

Systematic Experiment of Mott Scattering

Mott散乱の系統的実験

Author (6)： KOHASHI Teruo (Angstrom Technol. Partnership (ATP), Ibaraki, JPN) ,  KOHASHI Teruo (Hitachi Ltd., Tokyo, JPN) ,  KONOTO Makoto (Angstrom Technol. Partnership (ATP), Ibaraki, JPN) ,  KONOTO Makoto (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN) ,  KOIKE Kazuyuki (Hitachi Ltd., Tokyo, JPN) ,  KOIKE Kazuyuki (National Inst. of Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
Material： Japanese Journal of Applied Physics. Part 1. Regular Papers, Short Notes & Review Papers  (Japanese Journal of Applied Physics. Part 1. Regular Papers, Brief Communications & Review Papers)
Volume： 45  Issue： 8A  Page： 6468-6474  Publication year： Aug. 15, 2006 
JST Material Number： G0520B  ISSN： 0021-4922  Document type： Article
Article type： 短報  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： film thickness ,...
Semi thesaurus term： *Mott scattering

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JST classification (1)： Measuring methods and instruments of magnetism  (AD07060U)

Reference (28)：

• K. Koike and K. Hayakawa: Jpn. J. Appl. Phys.23(1984) L187.
• H. P. Oepen and J. Kirschner: Phys. Rev. Lett.62(1989)819.
• J. Unguris, G. G. Hembree, R. J. Celotta and D. T. Pierce: J. Magn. Magn. Mater.54(1986)1629.
• R. Allenspach, M. Stampanoni and A. Bischof: Phys. Rev. Lett.65(1990)3344.
• U. Heinzmann: in Photoemission and Absorption Spectroscopy of Solid and Interfaces with Synchrotron Radiation, ed. M. Capagna and R. Rosei (North-Holland, Amsterdam, 1990).

Terms in the title (3)： Mott散乱 ,  系統 ,  実験