Art

J-GLOBAL ID：200902264373457247   Reference number：06A0333712

High-resolution ab initio three-dimensional x-ray diffraction microscopy

高分解能ab initio三次元X線回折顕微鏡法

Author (14)： CHAPMAN Henry N. (Univ. of California, Lawrence Livermore National Lab., 7000 East Avenue, Livermore, California 94550) ,  BARTY Anton (Univ. of California, Lawrence Livermore National Lab., 7000 East Avenue, Livermore, California 94550) ,  MARCHESINI Stefano (Univ. of California, Lawrence Livermore National Lab., 7000 East Avenue, Livermore, California 94550) ,  NOY Aleksandr (Univ. of California, Lawrence Livermore National Lab., 7000 East Avenue, Livermore, California 94550) ,  HAU-RIEGE Stefan P. (Univ. of California, Lawrence Livermore National Lab., 7000 East Avenue, Livermore, California 94550) ,  CUI Congwu (Advanced Light Source, Lawrence Berkeley National Lab., 1 Cyclotron Road, Berkeley, California 94720) ,  HOWELLS Malcolm R. (Advanced Light Source, Lawrence Berkeley National Lab., 1 Cyclotron Road, Berkeley, California 94720) ,  ROSEN Rachel (Advanced Light Source, Lawrence Berkeley National Lab., 1 Cyclotron Road, Berkeley, California 94720) ,  HE Haifeng (Dep. of Physics and Astronomy, Arizona State Univ., Tempe, Arizona 85287-1504) ,  SPENCE John C. H. (Dep. of Physics and Astronomy, Arizona State Univ., Tempe, Arizona 85287-1504) ,  WEIERSTALL Uwe (Dep. of Physics and Astronomy, Arizona State Univ., Tempe, Arizona 85287-1504) ,  BEETZ Tobias (Dep. of Physics and Astronomy, Stony Brook Univ., Stony Brook, New York 11794-3800) ,  JACOBSEN Chris (Dep. of Physics and Astronomy, Stony Brook Univ., Stony Brook, New York 11794-3800) ,  SHAPIRO David (Dep. of Physics and Astronomy, Stony Brook Univ., Stony Brook, New York 11794-3800)
Material： Journal of the Optical Society of America. A. Optics, Image Science, and Vision  (J Opt Soc America A Opt Image Sci Vis)
Volume： 23  Issue： 5  Page： 1179-1200  Publication year： May. 2006 
JST Material Number： C0327B  ISSN： 1084-7529  CODEN： JOAOD6  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *X-ray diffraction topography ,...
Semi thesaurus term： *ab initio三次元X線回折顕微鏡法 ,...

   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=06A0333712&from=J-GLOBAL&jstjournalNo=C0327B") }}

JST classification (1)： X-ray diffraction methods  (BK01020I)

Terms in the title (2)： 高分解能 ,  X線回折顕微鏡法