DC Potential Non-Destructive Test by Using Neural Network Designed by Multi Objective Genetic Algorithm.

YONETSU DAIGO; KASHIMA KAZUHISA; HIGASHINO HIROYUKI; HARA TAKEHISA

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J-GLOBAL ID：200902270829809272 Reference number：04A0792398

DC Potential Non-Destructive Test by Using Neural Network Designed by Multi Objective Genetic Algorithm.

MOGAによる最適設計NNを用いた直流電位差欠陥診断法

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Material：
Volume： 23 Issue： 3 Page： 221-227 Publication year： Sep. 15, 2004
JST Material Number： L0458A ISSN： 0285-9947 Document type： Article
Article type：原著論文 Country of issue： Japan (JPN) Language： JAPANESE (JA)

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Quality inspection , Neurocomputers

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