Art
J-GLOBAL ID:200902271497087690   Reference number:08A0631747

On-site Determination of Trace Nickel in Liquid Samples for Semiconductor Manufacturing by Highly Sensitive Solid-phase Colorimetry with α-Furil Dioxime

半導体製造工程に用いる液体試料中の痕跡ニッケルの,α-フリルジオキシムを用いる高感度固相比色分析によるオンサイト定量分析
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Material:
Volume: 37  Issue:Page: 792-793 (J-STAGE)  Publication year: 2008 
JST Material Number: S0742A  ISSN: 0366-7022  CODEN: CMLTAG  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

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Chemical analysis of metals and alloys  ,  Manufacturing technology of solid-state devices 
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Reference (11):
  • 1) a) I. Ishida, T. Osakabe, M. Saita, Jpn. Kokai Tokkyo Koho 2008 31,009, 2008.
  •  b) M. Inoko, T. Yamashita, Jpn. Kokai Tokkyo Koho 2007 138,233, 2007.
  •  c) K. Ando, Y. Hara, M. Hotta, Jpn. Kokai Tokkyo Koho 2005 1,955, 2005.
  •  d) S. Miyazaki, Jpn. Kokai Tokkyo Koho 2001 250,807, 2001.
  •  e) I. Uchiyama, H. Takamatsu, T. Ajito, Jpn. Kokai Tokkyo Koho 10 310,883, 1998.
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