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J-GLOBAL ID：200902272012502836   Reference number：07A0820280

Temperature-dependent leakage mechanisms of Pt/BiFeO3/SrRuO3 thin film capacitors

Pt/BiFeO₃/SrRuO₃薄膜コンデンサの温度依存漏れ機構

Author (10)： YANG H. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...) ,  JAIN M. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...) ,  SUVOROVA N. A. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...) ,  ZHOU H. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...) ,  LUO H. M. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...) ,  FELDMANN D. M. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...) ,  DOWDEN P. C. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...) ,  DEPAULA R. F. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...) ,  FOLTYN S. R. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...) ,  JIA Q. X. (Superconductivity Technol. Center, Materials Physics and Applications Div., Los Alamos National Lab., Los Alamos ...)
Material： Applied Physics Letters  (Appl Phys Lett)
Volume： 91  Issue： 7  Page： 072911-072911-3  Publication year： Aug. 13, 2007 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *thin film condenser ,...
Semi thesaurus term： bias voltage

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JST classification (1)： LCR parts  (NA05030D)

Terms in the title (4)： Pt ,  BiFeO3 ,  薄膜コンデンサ ,  温度依存