Art
J-GLOBAL ID：200902275016244644   Reference number：06A0288968

Statistical Analysis of Lifetime Distribution for Optical Recordable Disks

光追記型デイスクのための寿命分布の統計的解析
Author (2)：
IRIE Mitsuru

About IRIE Mitsuru

(Osaka Sangyo Univ., Osaka, JPN)

About Osaka Sangyo Univ., Osaka, JPN

, 
OKINO Yoshihiro

About OKINO Yoshihiro

(Kansai Univ., Osaka, JPN)

About Kansai Univ., Osaka, JPN


Material：
Japanese Journal of Applied Physics. Part 1. Regular Papers, Short Notes & Review Papers  (Japanese Journal of Applied Physics. Part 1. Regular Papers, Brief Communications & Review Papers)

About Japanese Journal of Applied Physics. Part 1. Regular Papers, Short Notes & Review Papers


Volume： 45  Issue： 2B  Page： 1460-1462  Publication year： Feb. 28, 2006 
JST Material Number： G0520B  ISSN： 0021-4922  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
*optical disk

About optical disk

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
accelerated test

About accelerated test

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=06A0288968&from=J-GLOBAL&jstjournalNo=G0520B") }}
JST classification (3)：
JST classification
Category name(code) classified by JST.
Electronic recording,magnetic recording,optical recording 
(NC06020F)

About Electronic recording,magnetic recording,optical recording

,  Memory units 
(JC04060F)

About Memory units

,  Reliability 
(KB04040H)

About Reliability

Reference (3)：
  • M. Irie, Y. Okino and T. Kubo: Tech. Dig. ISOM 2004, 2004, p. 118.
  • P. A. Tobias and D. C. Trindade: Applied Reliability (Van Nostrand Reinhold, New York, 1995) 2nd ed., Chap. 7, p. 191.
  • ISO 18927(2002).
Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
追記型

About 追記型

, 
寿命分布

About 寿命分布

, 
統計的解析

About 統計的解析


Return to Previous Page

TOP

BOTTOM