Art
J-GLOBAL ID:200902276737610435   Reference number:05A0408780

New Type Fault in Single Electron Logic Circuits

単一電子論理回路における新しいタイプの故障
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Volume: J88-D-1  Issue:Page: 949-957  Publication year: May. 01, 2005 
JST Material Number: S0757B  ISSN: 0915-1915  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Logic circuits  ,  Measurement,testing and reliability of solid-state devices 
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