Art
J-GLOBAL ID:200902279949370026   Reference number:08A0495245

A New Method for RTS Noise of Semiconductor Devices Identification

半導体デバイス識別のRTS雑音のための新しい方法
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Material:
Volume: 57  Issue:Page: 1199-1206  Publication year: Jun. 2008 
JST Material Number: C0232A  ISSN: 0018-9456  CODEN: IEIMAO  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

JST classification (2):
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices  ,  Noise in general 
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