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J-GLOBAL ID：200902282021847604   Reference number：08A0340825

Atomically resolved imaging by low-temperature frequency-modulation atomic force microscopy using a quartz length-extension resonator

水晶長さ伸長共鳴器を用いた低温周波数変調原子間力顕微鏡による原子的に分解した画像化

Author (7)： AN Toshu (The Inst. for Solid State Physics, The Univ. of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, Japan and PRESTO ...) ,  NISHIO Takahiro (The Inst. for Solid State Physics, The Univ. of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, JPN) ,  EGUCHI Toyoaki (The Inst. for Solid State Physics, The Univ. of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, JPN) ,  ONO Masanori (The Inst. for Solid State Physics, The Univ. of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, JPN) ,  NOMURA Atsushi (The Inst. for Solid State Physics, The Univ. of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, JPN) ,  AKIYAMA Kotone (The Inst. for Solid State Physics, The Univ. of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, Japan and PRESTO ...) ,  HASEGAWA Yukio (The Inst. for Solid State Physics, The Univ. of Tokyo, 5-1-5 Kashiwa-no-ha, Kashiwa 277-8581, Japan and PRESTO ...)
Material： Review of Scientific Instruments  (Rev Sci Instrum)
Volume： 79  Issue： 3  Page： 033703  Publication year： Mar. 2008 
JST Material Number： D0517A  ISSN： 0034-6748  CODEN： RSINAK  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *crystal oscillator ,  *atomic force microscope ,  *image ,  *visualization ,  space resolving power ,  silicon

JST classification (1)： Electron and ion microscopes  (BD02050B)

Terms in the title (7)： 水晶 ,  共鳴器 ,  低温 ,  周波数変調原子間力顕微鏡 ,  原子 ,  分解 ,  画像化