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J-GLOBAL ID:200902282060081880   Reference number:04A0512700

Effects of Protecting Group on Resist Characteristics of Acryl Polymers for 193 nm Lithography

193nmリソグラフィー用のアクリル重合体のレジスト特性に及ぼす保護基の影響
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Material:
Volume: 17  Issue:Page: 483-488  Publication year: 2004 
JST Material Number: L0202A  ISSN: 0914-9244  CODEN: JSTEEW  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Copolymerization  ,  Aliphatic carboxylic esters,anhydrides,acid halides,acyl peroxides  ,  Manufacturing technology of solid-state devices 
Reference (19):
  • 1. T. I. Wallow, F. M. Houlihan, O. Nalamasu, E. A. Chandross, T. X. Neenan, and E. Reichmanis, Proc. SPIE, 2724 (1996) 355.
  • 2. K. Maeda, K. Nakano, T. Ohfuji, and E. Hasegawa, Proc. SPIE, 2724 (1996) 377.
  • 3. S. Takeichi, M. Takahashi, A. Kotachi, K. Nozaki, E. Yano, and I. Hanyu, J. Photopolym. Sci. Technol. 9 (1996) 475.
  • 4. K. Nozaki, K. Watanabe, and E. Yano, J. Photopolym. Sci.Technol. 9 (1996) 509.
  • 5. K. Maeda, K. Nakano, S. Iwasa, and E. Hasegawa, Proc. SPIE, 3049 (1997) 55.
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