A Simple On-Chip Repetitive Sampling Setup for the Quantification of Substrate Noise

DE WILDE Michiel; MEEUS Wim; ROMBOUTS Pieter; VAN CAMPENHOUT Jan

Art

J-GLOBAL ID：200902289614478910 Reference number：06A0345545

A Simple On-Chip Repetitive Sampling Setup for the Quantification of Substrate Noise

基板雑音の定量化に対する単純なオンチップ反復サンプリング段取り

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Material：
Volume： 41 Issue： 5 Page： 1062-1072 Publication year： May. 2006
JST Material Number： B0761A ISSN： 0018-9200 CODEN： IJSCBC Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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General , Measurement,testing and reliability of solid-state devices , Noise measurement

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