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J-GLOBAL ID:200902290378271746   Reference number:03A0692626

Low-Temperature Boron Gettering for Improving the Carrier Lifetime in Fe-Contaminated Bifacial Silicon Solar Cells with n+pp+ Back-Surface-Field Structure

n+pp+背面電場構造をもつFe汚染両面シリコン太陽電池におけるキャリア寿命を改善するための低温ほう素ゲッタリング
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Material:
Volume: 42  Issue: 9A  Page: 5397-5404  Publication year: Sep. 15, 2003 
JST Material Number: G0520B  ISSN: 0021-4922  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Manufacturing technology of solid-state devices  ,  Solar cell 
Reference (23):
  • 1) T. Warabisako, K. Matsukuma, S. Kokunai, Y. Kida, T. Uematsu and H. Yagi: Proc. 23rd IEEE Photovoltaic Specialist Conf., 1993, p. 248.
  • 2) A. Moehlieck, I. Zanesco and A. Luque: Proc. 1st World Conf. and Exhibition on Photovoltaic Solar Energy Conversion 1994, p. 1663.
  • 3) K. A. Muenzer, K. H. Holdermann, R. E. Schlosser and S. Sterk: Proc. 2nd World Conf. and Exhibition on Photovoltaic Solar Energy Conversion, 1998, p. 1464.
  • 4) T. Uematsu, K. Tsutsui, Y. Yazawa, T. Warabisako, I. Araki, Y. Eguchi and T. Joge: Proc. 12th Int. Photovoltaic Science and Engineering Conf., 2001, p. 805.
  • 5) S. Nadahara: Proc. Defects in Silicon II, eds. W. M. Bullis, U. Gosele and F. Shimura (Electrochemical Society, Pennigton, NJ, 1991) p. 667.
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