The interference effect in an optical beam deflection detection system of a dynamic mode AFM

HUANG Qiang-Xian; HUANG Qiang-Xian; FEI Ye-Tai; GONDA Satoshi; MISUMI Ichiko; SATO Osamu; KEEM Taeho; KUROSAWA Tomizo

Art

J-GLOBAL ID：200902290840187489 Reference number：06A0499390

The interference effect in an optical beam deflection detection system of a dynamic mode AFM

動的モードAFMの光ビーム偏向検出システムにおける干渉効果

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Material：
Volume： 17 Issue： 6 Page： 1417-1423 Publication year： Jun. 2006
JST Material Number： C0354C ISSN： 0957-0233 CODEN： MSTCEP Document type： Article
Article type：原著論文 Country of issue： United Kingdom (GBR) Language： ENGLISH (EN)

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Electron and ion microscopes , Measuring instruments in general

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