Art
J-GLOBAL ID：200902291630615433   Reference number：05A0341143

Density Measurement of a Thin-Film by the Pressure-of-Flotation Method

圧力浮遊法による薄膜の密度測定
Author (3)：
WASEDA Atsushi

About WASEDA Atsushi

(National Inst. Advanced Industrial Sci. and Technol., Ibaraki, JPN)

About National Inst. Advanced Industrial Sci. and Technol., Ibaraki, JPN

, 
FUJII Kenichi

About FUJII Kenichi

(National Inst. Advanced Industrial Sci. and Technol., Ibaraki, JPN)

About National Inst. Advanced Industrial Sci. and Technol., Ibaraki, JPN

, 
TAKETOSHI Naoyuki

About TAKETOSHI Naoyuki

(National Inst. Advanced Industrial Sci. and Technol., Ibaraki, JPN)

About National Inst. Advanced Industrial Sci. and Technol., Ibaraki, JPN


Material：
IEEE Transactions on Instrumentation and Measurement  (IEEE Trans Instrum Meas)

About IEEE Transactions on Instrumentation and Measurement


Volume： 54  Issue： 2  Page： 882-885  Publication year： Apr. 2005 
JST Material Number： C0232A  ISSN： 0018-9456  CODEN： IEIMAO  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*silicon

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,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
Avogadro's number

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JST classification (2)：
JST classification
Category name(code) classified by JST.
Measuring methods and instruments of mass,density,specific gravity 
(AD05030Z)

About Measuring methods and instruments of mass,density,specific gravity

,  Metallic thin films 
(BK14030T)

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Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
浮遊

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, 
薄膜

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, 
密度測定

About 密度測定


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