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J-GLOBAL ID：200902293017477632   Reference number：08A0056478

Optimized measurement probe of the localized surface plasmon microscope by using radially polarized illumination

半径方向に偏光した照射を用いる局所表面プラズモン顕微鏡の最適化した測定検出端
Author (3)：
WATANABE Kouyou

About WATANABE Kouyou

, 
HORIGUCHI Nobuhiro

About HORIGUCHI Nobuhiro

, 
KANO Hiroshi

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Material：
Applied Optics  (Lasers, Photonics, and Environmental Optics)

About Applied Optics


Volume： 46  Issue： 22  Page： 4985-4990  Publication year： Aug. 01, 2007 
JST Material Number： B0026B  ISSN： 1559-128X  CODEN： APOPAI  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*polarimetry(measurement)

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,...
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liquid crystal cell

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JST classification (2)：
JST classification
Category name(code) classified by JST.
Polarimetry and polarimeters 
(BD07050K)

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,  Solid-state plasmas 
(BM02160W)

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Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
半径方向

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, 
偏光

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, 
表面プラズモン

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, 
顕微鏡

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, 
最適化

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