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J-GLOBAL ID:200902298352049574   Reference number:09A0154112

Coarse-Grained Analysis of Crystalline Defects Caused by Ion Beam Irradiation:PM (Pixel Mapping) Method

イオンビームに誘起される格子欠陥の粗視化解析
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Volume: 129  Issue:Page: 238-243 (J-STAGE)  Publication year: 2009 
JST Material Number: S0810A  ISSN: 0385-4221  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Experimental techniques of observation of lattice defects 
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