Art
J-GLOBAL ID：200902299697628476   Reference number：06A0074533

Novel Specimen Preparation Using a Broad-Argon Ion Beam

アルゴンイオンビームを用いた試料前処理法の検討
Author (2)：
NAGASAWA TADAHIRO

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(コニカミノルタテクノロジーセ 材料技研)

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, 
WATANABE TOSHIO

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(コニカミノルタテクノロジーセ 材料技研)

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Material：
Konica Minolta Technology Report  (Konica Minolta Technol Rep)

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Volume： 3  Page： 84-87  Publication year： Jan. 2006 
JST Material Number： L4876A  ISSN： 1880-7216  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
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*specimen for microscopy

About specimen for microscopy

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
SEM

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,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Metallography 
(WB01010R)

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Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
アルゴン

About アルゴン

, 
イオンビーム

About イオンビーム

, 
試料

About 試料

, 
前処理

About 前処理


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