Proj
J-GLOBAL ID：200904018664744541 Research Project code：9800026363
Update date：Mar. 31, 1995
Optical evaluation technology for semiconductor thin films
光学的手法による半導体薄膜の評価技術に関する研究
Study period：
1994 - 1994
Organization (1)：
The University of Tokyo The Faculty of Engineering
About The University of Tokyo The Faculty of Engineering
Search "201551000096160140"
Search "The University of Tokyo The Faculty of Engineering"
Detailed information
Investigating Researcher (1)：
KATODA Takashi
About KATODA Takashi
Search "200901100534396751"
Search "KATODA Takashi"
(高知工科大)
About 高知工科大
Search "高知工科大"
Keywords (7)：
semiconductor
, evaluation
, laser
, Raman
, structure
, electrical
, evaluation
Research program：
Ordinary Research
Research budget：
1994: \2,600,000
Return to Previous Page
TOP
