Proj
J-GLOBAL ID:200904026786549521  Research Project code:9800004076 Update date:Jan. 30, 1995

Analysis of surface and interface structures by X-ray diffraction

X線回折法による結晶材料表面,界面構造の研究
Study period:0 - 1993
Organization (1):
Investigating Researcher (2):
Research overview:
Reconstructed surface structures of clean semiconductor crystals, super structures of adsorped heavy metal atoms and structures of overlayer interfaces are studied by X-ray totalreflection-diffraction and standing wave techniques.
Keywords (10):
crystal ,  structure ,  X-ray ,  total ,  surface ,  semiconductor ,  superlattice ,  epitaxy ,  thin ,  standing
Research program: Ordinary Research

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