Research Project code：9800011708
Update date：Dec. 15, 2003
Advanced internal inspection technology for composite substances (Regional large-scale project)
1990 - 1994
Investigating Researcher (2)：
For the purpose to establish the estimation system of electron devices such as Hybrid IC with Advanced Internal Inspection Technology, in the first term, the Hybrid IC offered from some enterprises is studied by ultrasonic imaging system. In the next term, its cross section is observed by SEM and EDS. And also the sample as heat treated is estimated. SEM: Scanning Electron Microscope, EDS: Energy Dispersive X-ray Spectrometer.
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