Proj
J-GLOBAL ID:200904059542090395  Research Project code:9800021498 Update date:Dec. 01, 2003

Development of high accuracy testing systems by compound sensing

複合センシング方式による高精度検査システムの開発
Study period:1993 - 1994
Organization (1):
Investigating Researcher (9):
Research overview:
By image processing techology, using CCD area sensor camaras, line sensor cameras and beam sensors, adjust electrical indicating meters and small size panel meters, and test defects of high accuracy label qualities automatically. Using PLD and FPGA, compose original LSI for rapid image recognition.
Keywords (8):
testing ,  computer ,  flaw ,  electrical ,  character ,  automation ,  display ,  machining
Research program: Ordinary Research
Research budget: 1994: \0

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